Infrared characterization of some oxygen-related defects in Czochralski silicon
Tomas Hallberg
Bok Engelsk 1993
| Utgitt | Linköping : Linköping University, Department of Physics and Measurement Technology , 1993
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| Omfang | [44] s. : ill.
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| Opplysninger | Avh. (tekn. lic.) - Universitetet i Linköping, 1993.
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| Emner | |
| ISBN | 9178711355
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