Physical aspects of electron microscopy and microbeam analysis
edited by Benjamin M. Siegel and Donald R. Beaman
Bok Engelsk 1975
Utgitt | New York : Wiley , c1975
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Omfang | XIII, 474 s. : ill.
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Opplysninger | "A Wiley Biomedical-Health publication"
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Emner | |
ISBN | 0471790206
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