Proceedings : 2010 19th IEEE Asian Test Symposium : ATS 2010 : 1-4 December 2010, Shanghai, China /
[sponsored by IEEE Computer Society Test Technology Council].
Bok Engelsk Asian Test Symposium
| Annen tittel | |
|---|---|
| Utgitt | IEEE
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| Omfang | xviii, 453 p. : : ill. ;
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| Opplysninger | "IEEE Computer Society Order Number P4248"--T.p. verso.
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| Emner | |
| Dewey |
