2006 IEEE International Test Conference : Santa Clara, CA : 22-27 October 2006.

International Test Conference
Bok · Engelsk

Annen tittel	2006 IEEE International Test Conference . - Autonomic Computing
Utgitt	IEEE
Emner	Electronic digital computers - Circuits - Testing Integrated circuits - Testing Radio frequency Telecommunication
Dewey	621.3815/48
ISBN	1-5090-9088-6