System-on-chip test architectures : nanometer design for testability

edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba
Bok · Engelsk · 2008

Annen tittel	2014 27th IEEE International System-on-Chip Conference
Utgitt	Amsterdam : Elsevier , c2008
Omfang	XXXVI, 856 s. : ill.
Emner	Integrerte kretser - Testing soc
ISBN	9780123739735