Applications and metrology at nanometer scale 2 : measurement systems, quantum engineering and RBDO method /

Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami.
Bok · Engelsk · 2021 · Electronic books.

Annen tittel	Applications and Metrology at Nanometer-Scale 2
Medvirkende	El Hami, Abdelkhalak, (author.)
Utgitt	Wiley-ISTE
Omfang	1 online resource (279 pages) : : illustrations
Emner	Metrology.
Sjanger	Electronic books.
Dewey	389.1
ISBN	1-119-81896-6