Neural models and algorithms for digital testing
by Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushnell
Bok Engelsk 1991
| Utgitt | Boston : Kluwer , c1991
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| Omfang | xii, 184 s. : ill.
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| Emner | Automatic checkout equipment
Digital integrated circuits - Testing Data processing Logic circuits - Testing Integrerte kretser - Prøving Vis mer... Koblingsalgebra
Logiske kretser Nevrale modeller Testing digitale kretser logiske elementer databehandling integrerte-kretser koblingsalgebra logiske-kretser nevrale-modeller |
| ISBN | 0792391659
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