Tutorial: test generation for VLSI chips

[edited by] Vishwani D. Agrawal and Sharad C. Seth
Bok · Språk ikke angitt · 1988

Utgitt	Washington, D.C. : IEEE Computer Society Press , c1988
Omfang	x, 401 s. : ill.
Emner	Computer vision - Congresses Pattern recognition systems - Congresses Integrerte kretser - Prøving Testing Vis mer... Utprøving VLSI Vlsi vlsi integrerte kretser
ISBN	0818647868. - 081868786X