Design for at-speed test, diagnosis and measurement

edited by Benoit Nadeau-Dostie
Bok · Engelsk · 2000

Utgitt	Boston : Kluwer Academic Publishers , c2000
Omfang	XVII, 239 s. : ill.
Emner	Electronic apparatus and appliances - Testing Integrated circuits - Testing Integrerte kretser - Testing
ISBN	0792386698. - 9780792386698