IDDQ testing of VLSI circuits

edited by Ravi K. Gulati and Charles F. Hawkins
Bok · Engelsk · 1993

Utgitt	Boston : Kluwer , c1993
Omfang	120 s. : ill.
Opplysninger	"A special issue of Journal of electronic testing: Theory and applications. - "Reprinted from Journal of electronic testing: Theory and applications, vol. 3, no. 4"
Emner	Integrated circuits - Very large scale integration Testing Metal oxide semiconductors, Complementary - Testing VLSI - Prøving
ISBN	0792393155