The influence of process-induced defects on electrical properties of silicon junctions
Gert I. Andersson
Bok Engelsk 1992
| Utgitt | Göteborg : Department of Solid State Electronics, Chalmers University of Technology , 1992
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|---|---|
| Omfang | 1 b. (flere pag.) : ill.
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| Opplysninger | Påstemplet: Doktorsavhandlingar vid Chalmers tekniska högskola. Ny serie. Nr 844.
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| Emner | |
| ISBN | 9170326754
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