Electrical characterization of metal-oxide-silicon structures with ultra thin oxide layers
Per Lundgren
Bok Engelsk 1996
| Utgitt | Göteborg : Department of Solid State Electronics, Chalmers University of Technology , 1996
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|---|---|
| Omfang | 55, [86] s. : ill.
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| Opplysninger | Påstemplet: Doktorsavhandlingar vid Chalmers tekniska högskola. Ny serie. Nr 1222.
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| Emner | |
| ISBN | 9171973664
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