Characterization of crystal growth defects by X-ray methods
edited by Brian K. Tanner and D. Keith Bowen
Bok Engelsk 1980 NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods
| Utgitt | New York : Plenum Press , c1980
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| Omfang | xxvi, 589 s. : ill.
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| Opplysninger | "Proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-Ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom"
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| Emner | |
| ISBN | 0306406284
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