Computed electron micrographs and defect identification

A.K. Head ... [et al.]
Bok · Engelsk · 1973

Utgitt	Amsterdam : North-Holland , 1973
Omfang	X, 400 s. : ill.
Emner	Electron microscopy - Data processing Metals - Defects Data processing Databehandling Elektronmikroskopi Vis mer... Gitterfeil : (NO-TrBIB)REAL013909 Krystallfeil krystallfeil elektronmikroskopi databehandling
ISBN	0444104623. - 0720417570