Characterization and modeling of electrically active point defects in silicon/silicon dioxide structures
Mats O. Andersson
Bok Engelsk 1991
| Utgitt | Göteborg : Department of Solid State Electronics, Chalmers University of Technology , 1991
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| Omfang | 1 b. (flere pag.) : ill.
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| Opplysninger | Påstemplet: Doktorsavhandlingar vid Chalmers tekniska høgskola. Ny serie Nr 829
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| Emner | |
| ISBN | 9170326320
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