Design and analysis of accelerated tests for mission critical reliability
Michael J. LuValle, Bruce G. Lefevre, SriRaman Kannan
Bok Engelsk 2004
Utgitt | Boca Raton, Fla. : Chapman & Hall/CRC , c2004
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Omfang | 236 s. : ill.
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Emner | |
ISBN | 1584884711
|
Utgitt | Boca Raton, Fla. : Chapman & Hall/CRC , c2004
|
---|---|
Omfang | 236 s. : ill.
|
Emner | |
ISBN | 1584884711
|