Physical aspects of electron microscopy and microbeam analysis
edited by Benjamin M. Siegel and Donald R. Beaman
Bok Engelsk 1975
| Utgitt | New York : Wiley , c1975
|
|---|---|
| Omfang | XIII, 474 s. : ill.
|
| Opplysninger | "A Wiley Biomedical-Health publication"
|
| Emner | |
| ISBN | 0471790206
|
