Secondary ion mass spectrometry : a practical handbook for depth profiling and bulk impurity analysis
R. G. Wilson, F. A. Stevie, C. W. Magee
Bok Engelsk 1989 R.G. Wilson
| Utgitt | New York : Wiley , c1989
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|---|---|
| Omfang | 1 b. (flere pag.) : ill.
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| Emner | |
| ISBN | 0471519456
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