Semiconductor reliability : based on the Conference on Reliability of Semiconductor Devices, 1961
edited by John E. Shwop, Harold J. Sullivan
Bok Engelsk 1961 Conference on Reliability of Semiconductor Devices
| Utgitt | Elizabeth, N.J. : Engineering Publishers , c1961
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|---|---|
| Omfang | IX, 309 s. : ill.
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| Emner |
