Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18 : Sendai, Japan, July 23-28, 1995. Pt. 2.
International Conference on Defects in Semiconductors (18 : 1995 Sendai)
Bok Engelsk 1995
| Utgitt | Zuerich-Uetikon : Trans Tech Publications , c1995
|
|---|---|
| Omfang | XXXVII s., s. 579-1107, XL-LXIII
|
| Emner | |
| ISBN | 0878497137. - 0878497161
|
