Fringe pattern analysis : 8-9 August 1989, San Diego, California
Graeme T. Reid, chair/editor ; sponsored by SPIE - the International Society for Optical Engineering ; cooperating organizations: Applied Optics Laboratory, New Mexico State University ... [et al.]
Bok Engelsk 1989
| Utgitt | Bellingham, Wash. , c1989
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|---|---|
| Omfang | vi, 260 s. : ill.
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| Opplysninger | "... part of a four-conference program on Interferometry, Microscopy, and Testing held at SPIE's 33rd Annual International Symposium on Optical & Optoelectronic Applied Science & Engineering" - Side v.
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| ISBN | 0819401994
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