X-ray microscopy II : proceedings of the 2nd International Symposium, Brookhaven, NY, August 31-September 4, 1987
D. Sayre, M. Howells, J. Kirz, H. Rarback (eds)
Bok Engelsk 1988
| Utgitt | Berlin : Springer-Verlag , c1988
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|---|---|
| Omfang | xiv, 454 s. : ill.
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| Emner | |
| ISBN | 0387193928. - 3540193928
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