Fifth IUMRS International Conference on Advanced Materials : Beijing, People's Republic of China, June 13-18, 1999 : Symposium GG: Advanced Materials Characterization and Imaging
editors: M.G. Burke ... [et al.]
Bok Engelsk 2000 Symposium GG: Advanced Materials Characterization and Imaging
| Utgitt | New York : Elsevier , c2000
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|---|---|
| Omfang | S. 347-457 : ill.
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| Opplysninger | Over tittelen: Special issue
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