Spectroscopic characterization techniques for semiconductor technology V : 25-26 January 1994, Los Angeles, California
Orest J. Glembocki, chair/editor ; sponsored and published by SPIE - the International Society for Optical Engineering ; cooperating organization, Center for Advanced Technology for Ultrafast Photonic Materials and Applications, City University of New York
Bok Engelsk 1994
| Utgitt | Bellingham, Wash. : SPIE , c1994
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|---|---|
| Omfang | V, 220 s. : ill.
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| ISBN | 0819414360
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