Spectroscopic characterization techniques for semiconductor technology III : 14-15 March 1988, Newport Beach, California
Orest J. Glembocki, Fred H. Pollak, Fernando Ponce, chairs/editors ; sponsored by Optical Society of America, SPIE - the International Society for Optical Engineering ; cooperating organization, the Metallurgical Society
Bok Engelsk 1988
| Utgitt | Bellingham, Wash. , c1988
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| Omfang | viii, 234 s. : ill.
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| Opplysninger | Basert på Symposium on Advances in Semiconductors and Superconductors: Physics and Device Applications.
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| ISBN | 0892529814
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