Advanced photon and particle techniques for the characterization of defects in solids : symposium held November 27-29, 1985, Boston, Massachusetts, U.S.A.

editors: J. B. Roberto, R. W. Carpenter, M. C. Wittels
Bok · Engelsk · 1985

Utgitt	Pittsburgh, Pa. , c1985
Omfang	xi, 390 s. : ill.
Opplysninger	"The Symposium on Advanced Photon and Particle Techniques for the Characterization of Defects in Solids was held on November 27-29, 1984, in Boston, Massachusetts, U.S.A." - Forordet.
Emner	Crystals - Defects Electron microscopy - Congresses. Particle beams - Congresses. Proton beams - Congresses. Vis mer... Elektronmikroskopi Faste stoffer - Struktur Krystallfeil Spektroskopi
ISBN	0091837065