Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002, Seattle, Washington, USA
· Angela Duparré, Bhanwar Singh, chairs/editors ; sponsored and published by SPIE - the International Society for Optical Engineering ; cooperating organizations: The Boeing Company (USA) ... [et al.]
Bok Engelsk 2002
| Utgitt | Bellingham, Wash. : SPIE , c2002
|
|---|---|
| Omfang | VIII, 192 s. : ill.
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| ISBN | 0819445460
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