Defects in SiO₂ and related dielectrics : science and technology
edited by G. Pacchioni, L. Skuja and D.L. Griscom
Bok Engelsk 2000 NATO Advanced Study Institute on Defects in SiO₂ and Related Dielectrics: Science and Technology
| Utgitt | Dordrecht : Kluwer , c2000
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| Omfang | VIII, 624 s. : ill.
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| Opplysninger | "Proceedings of the NATO Advanced Study Institute on Defects in SiO₂ and Related Dielectrics: Science and Technology, Erice, Italy, April 8-20, 2000" - Tittelsidens bakside
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| Emner | Crystals - Defects
Silica - Electric properties Dielektrika : (NO-TrBIB)REAL004386 Dielektrisitet Vis mer... Dielektriske materialer
Gitterfeil : (NO-TrBIB)REAL013909 Krystallfeil Materialer Silisiumdioksid krystallfeil silisiumdioksid dielektriske materialer dielektrisitet |
| ISBN | 0792366859. - 0792366867
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