
Atom probe microscopy
Baptiste Gault
Bok · Engelsk · 2012
Medvirkende | |
---|---|
Omfang | xxiii, 396 sider : illustrasjoner
|
Opplysninger | Preface -- Acknowledgements -- List of Acronyms and Abbreviations -- List of Terms -- List of Non-SI Units and Constant Values -- PART I Fundamentals -- 1. Introduction -- 2. Field Ion Microscopy -- 3 From Field Desorption Microscopy to Atom Probe Tomography -- Part II Practical aspects -- 4. Specimen Preparation -- 5. Experimental protocols in Field Ion Microscopy -- 6. Experimental protocols -- 7. Tomographic reconstruction -- PART III Applying atom probe techniques for materials science -- 8. Analysis techniques for atom probe tomography -- 9. Atom probe microscopy and materials science -- Appendices
|
Emner | |
ISBN | 9781461434351
|