IDDQ testing of VLSI circuits
edited by Ravi K. Gulati and Charles F. Hawkins
Bok Engelsk 1993
Utgitt | Boston : Kluwer , c1993
|
---|---|
Omfang | 120 s. : ill.
|
Opplysninger | "A special issue of Journal of electronic testing: Theory and applications. - "Reprinted from Journal of electronic testing: Theory and applications, vol. 3, no. 4"
|
Emner | |
ISBN | 0792393155
|