Three-dimensional imaging and laser-based systems for metrology and inspection III : 14-15 October 1997, Pittsburgh, Pennsylvania
· Kevin G. Harding, Donald J. Svetkoff, chairs/editors ; sponsored and published by SPIE - the International Society for Optical Engineering ; cooperating organizations: NIST - National Institute of Standards and Technology, CIMS - Coalition for Intelligent Manufacturing Systems, A-CIMS - Academic Coalition for Intelligent Manufacturing Systems
Bok Engelsk 1997