Microelectronic manufacturing yield, reliability, and failure analysis III : 1-2 October 1997, Austin, Texas
· Ali Keshavarzi, Sharad Prasad, Hans-Dieter Hartmann, chairs/editors ; sponsored and published by SPIE - the International Society for Optical Engineering ; cooperating organizations: SEMI - Semiconductor Equipment and Materials International, Solid State Technology, the Electrochemical Society
Bok Engelsk 1997