X-ray diffraction and ellipsometric studies of zinc sulfide thin films grown by atomic layer epitaxy
Markku Oikkonen
Bok Engelsk 1988
| Utgitt | Helsinki : Finnish Academy of Technology , 1988
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|---|---|
| Omfang | 46 s. : ill.
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| Opplysninger | Enkelte eksemplarer påstemplet: Dissertation 673 from Teknillinen korkeakoulu.
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| Emner | |
| ISBN | 9516662641
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