Thirteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : January 28-30, 1 - detaljert visning

Thirteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : January 28-30, 1997, Four Seasons Hotel, Austin, TX, USA


Utgitt	Piscataway, N.J. : Institute of Electrical and Electronics Engineers , c1997
Omfang	XVI, 291 s. : ill.
Emner	Elektronikk - Termiske egenskaper Elektroniske komponenter
ISBN	078033793X. - 0780337948. - 0780337956