Ion beam surface layer analysis : proceedings of the International Conference held on June 18-20, 19 - detaljert visning

Ion beam surface layer analysis : proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y.


Utgitt	Lausanne : Elsevier Sequoia , 1974
Omfang	VIII, 463 s. : ill.
Opplysninger	"These proceedings were originally published in Thin solid films"
Emner	Thin films - Congresses
ISBN	044419536X