Production testing of RF and system-on-a-chip devices for wireless communications
Keith B. Schaub, Joe Kelly.
Bok Engelsk 2004 · Electronic books.
Utgitt | Boston, MA : : Artech House, , c2004.
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Omfang | 1 online resource (271 p.)
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Opplysninger | Description based upon print version of record.. - Table of Contents vi; Preface xiii; Acknowledgments xvii; CHAPTER 1; An Introduction to Production Testing 1; CHAPTER 2; RF and SOC Devices 13; CHAPTER 3; Cost of Test 33; CHAPTER 4; Production Testing of RF Devices 49; CHAPTER 5; Production Testing of SOC Devices 95; CHAPTER 6; Fundamentals of Analog and Mixed-Signal Testing 145; CHAPTER 7; Moving Beyond Production Testing 175; CHAPTER 8; Production Noise Measurements 193; Appendix A: Power and Voltage Conversions 225; Appendix B: RF Coaxial Connectors 229; List of Acronyms and Abbreviations 233; List of Numerical Prefixes 237. - About the Authors 239Index 241. - With the increasing number of integrated wireless devices being developed with SOC (system on a chip) technology, a merger of RF and mixed-signal test approaches is quickly becoming a necessity. Addressing this need head-on, this first-of-its-kind resource offers you an in-depth overview of RF and SOC product testing for wireless communications. The book introduces new, creative methods that lead to more efficient testing, such as multi-site and parallel testing. You learn how to determine critical measurements for specific applications, including Bluetooth, WLAN, and 3G devices. Moreover, the
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Emner | |
Sjanger | |
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ISBN | 1580536921
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