Surface and interface characterization by electron optical methods


Utgitt	New York : Plenum Press , c1988
Omfang	VIII, 319 s. : ill.
Opplysninger	"Proceedings of a NATO Advanced Study Institute on the Study of Surfaces and Interfaces by Electron Optical Techniques, held April 4-15, 1987, in Erice, Sicily, Italy" - Tittelsidens bakside.
Emner	Electron microscope, Transmission - Congresses. Elektronmikroskopi Elektronoptikk Grenseflater Vis mer... Overflatefysikk Overflater overflater elektronmikroskopi grenseflater elektronoptikk
ISBN	030643086X

Biblioteksøk