Characterization of defects in materials : symposium held December 1-2, 1986, Boston, Massachusetts, - detaljert visning

Characterization of defects in materials : symposium held December 1-2, 1986, Boston, Massachusetts, USA

editors: Richard W. Siegel, Julia R. Weertman, Robert Sinclair
Bok Engelsk 1987


Utgitt	Pittsburgh, Pa. : Materials Research Society , c1987
Omfang	xv, 532 s. : ill.
Emner	Crystals - Defects Congresses Materials - Defects Congresses Gitterfeil Materialer materialer krystallfeil defekter
ISBN	0931837472