Hierarchical modeling for VLSI circuit testing

by Debashis Bhattacharya and John P. Hayes
Bok · Språk ikke angitt · 1990

Utgitt	Boston : Kluwer , c1990
Omfang	x, 159 s. : ill.
Emner	Integrated circuits - Very large scale integration Computer simulation Integrated circuits - Very large scale integration Testing Integrerte kretser - Prøving VLSI
ISBN	079239058X