Complex semiconductors operating at low temperatures : comparative life test evaluation of three var - detaljert visning

Complex semiconductors operating at low temperatures : comparative life test evaluation of three variants of 256Kx1 NMOS DRAM and three variants of 8Kx8 CMOS SRAM operating at low temperatures

Mogens Bo Christensen
Bok Dansk 1987


Utgitt	Hørsholm : Elektronikcentralen , 1987
Omfang	2, 30 s. : ill.
Emner	Halvledere (Elektronikk) Integrerte kretser MOS teknikk
ISBN	8773980781