Applications of X-ray topographic methods to materials science


Utgitt	New York : Plenum Press , c1984
Omfang	xiii, 536 s. : ill.
Opplysninger	"Based on the proceedings of the France-U.S.A. Seminar on Application of X-Ray Topographic Methods to Materials Science, held August 7-10, 1983, in Snowmass Village, Colorado" - Tittelsidens bakside.
Emner	Radiography, Industrial - Congresses. X-rays - Industrial applications Radiografisk materialprøving Røntgenkontroll Røntgenspektroskopi
ISBN	030641838X

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