Characterization of crystal growth defects by X-ray methods


Utgitt	New York : Plenum Press , c1980
Omfang	xxvi, 589 s. : ill.
Opplysninger	"Proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-Ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom"
Emner	Gitterfeil Krystallisering Krystallvekst Røntgenkrystallografi krystallvekst krystallfeil røntgenmetoder
ISBN	0306406284

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