Modeling of drain current and intrinsic capacitances in nanoscale double-gate and gate-all-around MOSFETs
Håkon Børli
Bok Engelsk 2008
Digital utgave: Søke-URL
Utgitt | Trondheim : Norwegian University of Science and Technology, Faculty of Information Technology, Mathematics and Electrical Engineering, Department of Electronics and Telecommunications , 2008
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Omfang | XX, 126 s. : ill.
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Opplysninger | Avhandling (ph.d.) - Norges teknisk-naturvitenskapelige universitet, Trondheim, 2008
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Emner | |
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ISBN | 9788247111710
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