Reliability, packaging, testing, and characterization of MEMS/MOEMS VII : 21-22 January 2008, San Jose, California, USA
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Allyson L. Hartzell , Rajeshuni Ramesham, editors ; sponsored by SPIE ; cosponsored by the Photonics Center at Boston University ; published by SPIE
Bok
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Engelsk
·2008
