Optical measurement systems for industrial inspection III : 23-26 June 2003, Munich, Germany
· Wolfgang Osten, Katherine Creath, Malgorzata Kujawinska, chairs/editors ; sponsored and published by SPIE - the International Society for Optical Engineering ; cosponsored by EOS - European Optical Society, WLT - Wissenschaftlice Gesellschaft Lasertechnik e.V (Germany)
Bok Engelsk 2003