Speckle metrology 2003 : proceedings : 18-20 June 2003, Trondheim, Norway
· editors: Kay Gastinger, Ole Johan Løkberg, Svein Winther ; sponsored and organized by SINTEF (Norway), NTNU - Norwegian University of Science and Technology (Norway) ; cooperating organizations: SPIE - the International Society for Optical Engineering, EOS - European Optical Society
Bok Engelsk 2003