Ion beam surface layer analysis : proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y.
edited by James W. Mayer and James F. Ziegler
Bok Engelsk 1974 International Conference on Ion Beam Surface Layer Analysis
| Utgitt | Lausanne : Elsevier Sequoia , 1974
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|---|---|
| Omfang | VIII, 463 s. : ill.
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| Opplysninger | "These proceedings were originally published in Thin solid films"
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| Emner | |
| ISBN | 044419536X
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