Design, test, integration, and packaging of MEMS/MOEMS : 9-11 May 2000, Paris, France
· Bernard Courtois ... [et al.], chairs/editors ; sponsored by CNRS-INPG-UJF (France), the Institute of Electrical and Electronics Engineers, IEEE Computer Society Test Technology Technical Council ; in cooperation with IEEE Components, Packaging, and Manufacturing Society, SPIE, the International Society for Optical Engineering, IEEE Circuits and Systems Society
Bok Engelsk 2000