Optoelectronic metrology : 28-30 September 1998, Łańcut, Poland
· Jan Owsik, Tomasz Wie̢cek, editors ; Wojciech Skrzeczanowski, Ewa Burdziakowska, co-editors ; organized by Institute of Optoelectronics, Military University of Technology, Warsaw (Poland), Central Office of Measures, Warsaw (Poland), Foundation for Industrial and Environmental Science, Rzeszów (Poland) ; sponsored by Committee for Scientific Research (Poland), SPIE Poland Chapter
Bok Engelsk 1998