Characterization of defects in materials : symposium held December 1-2, 1986, Boston, Massachusetts, USA
editors: Richard W. Siegel, Julia R. Weertman, Robert Sinclair
Bok Engelsk 1987
| Utgitt | Pittsburgh, Pa. : Materials Research Society , c1987
|
|---|---|
| Omfang | xv, 532 s. : ill.
|
| Emner | |
| ISBN | 0931837472
|
